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This Test Method may be applied to leadframes for L-leaded packages such as QFP
1-0312 - Specification for SECS-II Protocol Substrate Tracking
and electron beam processes
The qualification processes cover:
specifications and validated analytical procedures
M09400 - SEMI M94 - Specification for Silicon Carbide Engineered Substrates Revision:SEMI M94-0625 - Current This Test Method may be1 Purpose 1. 1 These specifications cover substrate requirements for silicon carbide engineered substrates including high purity silicon carbide layer of crystallographic polytype 4H used in semiconductor and electronic device manufacturing. 2 Scope 2. 1 A complete purchase specification may require the defining of additional physical, electrical, and bulk properties. These properties are listed, together with test methods suitable for determining
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US$ 135.00